Sankhya: The Indian Journal of Statistics

1993, Volume 55, Series B, Pt. 1, 57-64

CONTROL OF PROCESS AVERAGE BY TWO-SIDED GAUGING

By

BISWANATH DAS, Presidency College, Calcutta

 

SUMMARY. In the present work, a process control plan based on two-sided gauging in a situation where the process average is liable to shift on either side of the aimed value and the process variability is assumed to be controlled at a known level, has been developed by carrying out a sensitivity analysis on the performance indices of the plan with respect to the decision variables. The plan parameters (gauge-limits and control limits) have been numerically obtained for n = 2(1) 10, a = .005, .01, .025 and .05 assuming a normal model. A curtailed inverse sampling scheme has been suggested for the operation. The efficiency of the plan has been compared with that of the traditional $\overline{X}$-chart

AMS(1980)subject classification. 62N10

Key words and phrases. Gauging, minimax-risk and regret, curtailed inverse sampling scheme, power efficiency function

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